MORPHOLOGICAL CHARACTERIZATION ON THE NANO STRUCTURE OF SILVER OXIDE USING XRD TOOLS AND COMPUTATIONAL METHODS

Abstract

In this work, the nano silver oxide (Ag2O) was prepared in the shape of thin-film using Electron beam evaporation method to examine the structural and morphological properties, the fabricated material was annealed at 100º, 200º and 300º C temperatures respectively. The structural modifications and phase transitions were keenly observed at different annealed temperatures and the associated properties were determined by knowing the parameters. Theoretically predicted structures for Ag2O were displayed and they were validated with experimentally obtained structure. The XRD peaks from respective planes were observed and they were found to be well organized on different phase transitional structures. The morphological views at phase transitions were observed and the cause of modification of physical and chemical properties was keenly monitored. The fundamental lattice type of silver was viewed and the change of structure with respect to interstitial of O at lattice points was clearly displayed and the FCC face of Ag2O was demonstrated. The existence of micro-strain on lattice site was found and the effect of crystal reciprocity (BCC) was evaluated.

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Keywords: Ag2O, XRD, FCC, micro-strain and crystal reciprocity.

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