CHARACTERIZATIONS OF Sno2 NANO MATERIAL TOWARDS OPTO-ELECTRONIC PROPERTIES USING MORPHOLOGICAL AND OPTICAL TOOLS

Abstract

In this attempt, nanometrically pure and singe phase adopted SnO2 Nano material was prepared using popular sol-gel combustion route. The XRD measurements were carried out for comparing the calculated geometrical parameters with observed morphological results. The obtained XRD results proved the confined crystal structure of SnO2 and related optimized molecular structure was predicted. The active planes were identified and the XR reflections were validated with respect to corresponding planes. The particle size was measured from the observed data and it was validated from the calculated results. The nano view of crystal structure was displayed using SEM tool and it was ensured from the obtained pictures of TEM. The direct and indirect band gap (kubo gap) of materials was evaluated and it was compared with calculated data. The annealing temperature effect was observed at 200º, 400º and 600ºC respectively of the nano samples. The XPS data was recovered from the nano samples and the corresponding energy dispersion graph was viewed. The photoluminescence spectral pattern was displayed and the shift of pattern was keenly monitored and cause of shift was recognized.

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Keywords: SnO2, XR reflections, SEM, Photoluminescence, Kubo gap.

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